News

20 November 2009

 

Solar Metrology launches line-mountable XRF tool for CIGS

X-ray fluorescence (XRF) analysis system maker Solar Metrology of Hollbrook, NY, USA has expanded its SMX XRF tool portfolio for film composition and thickness measurement of copper indium gallium diselenide (CIGS) photovoltaic deposition with the addition of the System SMX-Remote static head ILH.

Solar Metrology says that its SMX metrology tool platform provides a production-ready suite of film thickness and composition measurement tools for research and process development, in-process monitoring and post-process quality control. The firm adds that XRF is an enabling technology for CIGS manufacture, delivering yield management and improvement by allowing in-situ process control.

The SMX-ILH in particular is an atmospheric in-line XRF metrology tool platform that provides composition and thickness measurements for thin-film solar PV metal film stacks on flexible roll-to-roll substrates such as stainless steel, aluminum and polyimide or rigid substrates such as float glass.

The system is designed to perform measurements in an atmospheric environment, either near-line or in-line. Remote SMX-ILH tool platform models are designed to measure in either one static location or across the gradient (points on a line perpendicular to motion) of the flexible or rigid glass substrates. Typical measurement applications include Mo (molybdenum) thickness and all CIGS combinations (including all CIG alloys and/or film combinations and final CIGS formulations).

The ILH platform includes both fully integrated, stand-alone tools and remote configurations that can be incorporated directly into a tool or line, providing the versatility and adaptability needed to match custom requirements at each XRF measurement point in the process, says the firm.

See related item:

Solar Metrology introduces in-situ XRF tool for CIGS composition and thickness measurement

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Visit: www.solarmetrology.com