News

22 September 2009

 

Solar Metrology introduces in-situ XRF tool for CIGS composition and thickness measurement

Solar Metrology of Holbrook, NY, USA says it has expanded its SMX XRF (X-Ray fluorescence) tool portfolio with the introduction of the System SMX-ISI, designed for film composition and thickness measurement of CIGS photovoltaic deposition.

System SMX-ISI is an in-situ XRF metrology tool platform that provides composition and thickness measurements for thin film solar PV metal film stacks on flexible roll-to-roll substrates, such as stainless steel, aluminum and polyimide or rigid substrates such as float glass. Typical measurement applications include Mo thickness and all CIGS combinations (including all CIG alloys and/or film combinations and final CIGS formulations), says the firm. Furthermore, the tool is fast, flexible and easily integrated into any vacuum deposition tool or vacuum process station or point of a vacuum process line.

Solar Metrology's SMX measurement tool platform provides a production-ready suite of film thickness and composition measurement tools for research and process development, in-process monitoring and post-process quality control.

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Visit: www.solarmetrology.com