Teradyne launches test system for 5G mmWave semiconductors

Automated test solutions provider Teradyne Inc of North Reading, MA, USA has launched the UltraWaveMX44, an UltraFLEX test solution for the new 5G-NR millimeter-wave (mmWave) market, enabling faster time to market and higher product yields for devices used in emerging 5G mmWave applications.

The UltraWaveMX44 supports characterization and production device testing for probe, package, over-the-air and module applications. Its patented active thermal control and NIST-traceable integrated calibration circuitry delivers what is claimed to be superior instrument performance and tester-to-tester repeatability for frequencies between 6GHz and 44GHz.

The UltraWaveMX44 maintains complete DIB (device interface board) and test cell compatibility with currently released wireless applications, such as LTE and WLAN, making it an upgrade solution for installed UltraFLEX systems while maximizing return on investment for new system purchases.

“Over the past two years, we have worked with our customer base to develop and validate the most effective mmWave production test solution,” says Stephen Pruitt, product marketing manager for wireless semiconductors. “UltraWaveMX44 is a true high-volume mmWave ATE [automated test equipment] instrument with innovative technology integration providing complete test coverage for complex 5G wireless devices,” he adds. “With this UltraFLEX solution, our customers can achieve the highest test quality without sacrificing compatibility or performance, all while realizing lower cost of test.”

This addition to the UltraFLEX platform leverages the test system’s native features of dedicated background DSP computers, IGXL software environment, fully integrated debug tools and instrument pattern support to deliver high test cell throughput and fast time to market.

Tags: Semiconductor test instrument

Visit: www.teradyne.com