LayTec metrology systems to be integrated into new Riber MBE cluster tool for ZSW’s CIGS solar cell growth

In-situ metrology system maker LayTec AG of Berlin, Germany says it has been chosen by molecular beam epitaxy (MBE) system maker Riber S.A. of Bezons, France and its customer ZSW (Center for Solar Energy and Hydrogen Research) in Stuttgart, Germany to supply a multi-station metrology system for monitoring and controlling CIGS (Cu(In,Ga)Se2) solar cell growth.

The multi-station metrology system will monitor multiple deposition steps, and comprise both in-situ and in-line methods including spectral reflectance, emissivity-corrected pyrometry and photoluminescence.

Beyond providing in-depth data for process analysis, the metrology systems will be directly embedded into the CRYSTAL XE control software of Riber’s automatic platform combining two clustered 4” MBE 412 systems, as well as further deposition technologies.

With LayTec’s metrology fully integrated into the new cluster tool, ZSW expects to gain deep insight into the effects governing the deposition processes for the manufacturing of CIGS thin-film solar cells. Resulting further process improvements are intended to boost CIGS solar energy conversion efficiency to values above 25%, i.e. beyond the existing record of 23.4%.

See related items:

Riber receives multi-million euro MBE system order from ZSW for research on CIGS PV

ZSW regains thin-film solar cell efficiency record with 22.6% CIGS PV cell

Tags: LayTec Metrology Riber MBEZSW CIGS

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