26 October 2016

Tektronix launches Keithley S540 power semiconductor test system targeting SiC and GaN devices up to 3kV

Test, measurement and monitoring equipment supplier Tektronix Inc of Beaverton, OR, USA has introduced the Keithley S540 Power Semiconductor Test System, a fully automated, 48-pin parametric test system for wafer-level testing of power semiconductor devices and structures up to 3kV. Optimized for use with compound power semiconductor materials including silicon carbide (SiC) and gallium nitride (GaN), the fully integrated S540 can perform all high-voltage, low-voltage, and capacitance tests in a single probe touch-down.

As demand for power semiconductor devices continues to increase and as SiC and GaN become more commercialized, manufacturers are adopting wafer-level testing in their production processes to optimize yields and improve profitability, says Tektronix. For these applications, the S540 lowers cost of ownership by minimizing test time, test set-up time and floor space while achieving lab-grade high-voltage measurement performance, it adds.

"Many fabs are using custom-built, hybrid test systems for power semiconductor testing that require manually changing test setups when moving from low-voltage to high-voltage tests," says Mike Flaherty, general manager of the Keithley product line. "As you might expect, this adds process steps and slows production," he adds. "In contrast, the S540 is a complete, fully integrated solution well suited for production environments where numerous devices must be tested quickly."

To deliver production-level performance, the S540 can perform parametric measurements on up to 48 pins without changing cables or probe card infrastructure. It can also perform transistor capacitance measurements such as Ciss, Coss, and Crss up to 3kV, again without manual reconfiguration of test pins. Further boosting test output, the S540 offers sub-pA measurement performance and can perform fully automated, high-voltage leakage current tests in <1s.

As a standard commercial product, the S540 offers fully traceable system specifications, safety compliance, diagnostics, and worldwide service and support, features that are often missing in home-built or custom systems. The S540 draws on Keithley's 30+ years of semiconductor parametric testing expertise, and safely and seamlessly integrates semiconductor test instrumentation with both low- and high-voltage switching matrices, cabling, probe card adapters, prober drivers and test software.

The Keithley S540 is available for order now, with delivery beginning in March 2017.

Tags: Tektronix

Visit: www.tek.com/keithley-s540-parametric-test-system