22 October 2012

Keithley introduces new parametric curve tracing technology for characterizing high power devices

Electrical test instrument and system provider Keithley Instruments Inc of Cleveland, OH, USA has introduced seven instrumentation, software, and test fixture configurations for parametric curve tracing applications for characterizing high power devices, including those based on silicon carbide (SiC) and gallium nitride (GaN) technology, at up to 3000V and 100A.

Lee Stauffer, a Keithley staff technologist, said, “Many power device developers have told us they like the dynamic range and ease of use of a traditional curve tracer, but they know they need more flexibility in configuring the measurement channels, as well as the accuracy, capability, and graphical user interface that a modern parametric analyzer offers.”

According to the firm, in contrast to solutions that require all instrumentation to be housed in a chassis, Keithley’s seven new configurations offer the flexibility to add new measurement channels economically as users’ needs evolve, with no need to return the system to the factory to install new hardware. For example, a user could start with an entry level Parametric Curve Tracer, then add the capabilities of additional System SourceMeter instruments, such as higher voltage and/or higher current, at a later date.

Six different System SourceMeter instrument models can be mixed and matched to create the optimum combination of voltage, current and power for the user’s specific needs. Keithley’s TSP‑Link virtual backplane technology allows users to incorporate any number of Source-Measure channels, all of which are fully and automatically synchronized with other SourceMeter instruments in the system.

All seven configurations include the latest version of Keithley’s ACS (Automated Characterization Suite) Basic Edition software, which supports Keithley’s newest SMUs and takes advantage of the Series 2600B’s TSP-Link connection trigger model, which allows for 500ns trigger synchronization between instruments. This tighter synchronization capability maximizes the high speed pulse mode capabilities of the new Model 2651A and Model 2657A High Power System SourceMeter instruments. The Windows-compatible ACS Basic Edition package provides control and analysis tools suited for high power device characterization, including complete parametric test libraries for MOSFETs, BJTs, triacs, diodes, IGBTs, and other device types. The software’s “trace” mode, which uses an on-screen slider control, allows users to control the level of voltage and current levels sourced interactively and to see how the power device responds in real time. The software’s “parametric” mode provides a “fill-in-the-blanks” GUI to configure a test precisely and a comprehensive set of tools for precise parameter extraction. All seven bundles also include all cabling and adapters required for system assembly, as well as a number of sample power devices useful for training and demonstration purposes.

Tags: Keithley Semiconductor test instrument

Visit: www.keithley.com