14 June 2012

LayTec’s GaN epi surface temperature measurement tool wins Aurora Award

On 11 June at the LEDforum 2012 in Guangzhou, China, LayTec AG of Berlin, Germany (which makes in-situ metrology systems for thin-film processes, focusing on compound semiconductor and photovoltaic applications) received the LEDinside ‘Aurora Award 2012’ for its Pyro 400 product in the category ‘Best LED Test Equipment’ (which recognizes outstanding products in the LED industry). At the award ceremony, the prize was presented to LayTec’s general sales manager Tom Thieme.

Pyro 400 is LayTec’s in-situ solution for the precise measurement of real surface temperature during gallium nitride (GaN) epitaxial growth. The near-ultraviolet (UV) pyrometry tool provides what is claimed to be a new quality of temperature control with unrivalled accuracy, and is of benefit in GaN-based LED and laser production because it directly correlates with the final device’s emission wavelength.

Pyro 400 can be combined with other LayTec in-situ monitoring systems for simultaneous measurements of GaN surface temperature with pocket temperature, reflectance and wafer curvature.

“I would like to thank all our customers who voted online for our product and the international prize committee for their decision,” comments LayTec’s CEO & president Thomas Zettler.

Tags: LayTec

Visit: www.laytec.de