News

18 June 2010

 

CRAIC launches microspectrophotometer for thin-film thickness measurements

UV-visible-NIR microscope and microspectrometer manufacturer CRAIC Technologies has launched the 20/20 Film microspectrophotometer, designed to measure the thickness of thin films of even sub-micron sampling areas rapidly and non-destructively.

Able to analyze films of many materials on both transparent and opaque substrates, the 20/20 Film enables the determination of thin-film thickness on everything from semiconductors to MEMS devices to hard disk drives to flat-panel displays. When combined with CRAIC's proprietary contamination imaging capabilities, the new microspectrophotometer represents a step forward in capabilities and flexibility, claims the firm.

Able to analyze films of many materials on both transparent and opaque substrates, the 20/20 Film enables the determination of thin-film thickness on everything from semiconductors to MEMS devices to hard disk drives to flat-panel displays. When combined with CRAIC's proprietary contamination imaging capabilities, the new microspectrophotometer represents a step forward in capabilities and flexibility, claims the firm.

“Many of our customers want to measure the thickness of thin films of smaller and smaller sampling areas for rapid quality control of their products,” says president Dr Paul Martin. “The 20/20 Film microspectrophotometer was built in response to customer requests for a powerful, flexible film thickness tool that can measure sub-micron areas on both transparent and opaque substrates,” he adds. “It can also be configured for contamination analysis, concentration and relative intensity mapping.”

The complete 20/20 Film solution combines microspectroscopy with software to enable the user to measure film thickness by either transmission or reflectance of many types of films and substrates. Due to the flexibility of the design, sampling areas can range from over 100 microns to less than a micron in width. Designed for the production environment, it incorporates a number of easily modified processing recipes, the ability to create new film recipes, and tools for analyzing data as well as options for automation including touchscreen control. The ability to directly image and analyze films with ultraviolet, visible and NIR microscopy can also be added to the instrument, says the firm.

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Visit: www.microspectra.com