News

19 January 2010

 

Accel-RF ships reliability test systems for European GaN device development

Accel-RF Corp of San Diego, CA, USA, which produces turn-key accelerated life-test/burn-in test systems for compound semiconductor devices, says that in fourth-quarter 2009 it installed five high-power reliability test systems at customers in Europe. Shipped to both government research and commercial entities, the systems will be instrumental in developing gallium nitride devices.

Founder & president Roland Shaw says that the shipments represent the acceptance of Accel-RF’s high-power reliability test systems by the compound semiconductor community to test the reliability of GaN technology in the European Union. Accel-RF has been selling RF reliability systems in the USA since 2004, but five systems delivered and installed in Europe in Q4/2009 further demonstrates expansion outside the USA, he adds.

Service and first-line support for the systems will be performed by Peritest Eurl, based near Paris, France. “Accel-RF’s technical staff will always be working with our customers,” Shaw says. “Peritest Eurl for sales, service, and first-line support in Europe has worked well for Accel-RF,” he adds. “Global expansion for complex equipment like ours has to be done carefully... even with this major expansion effort we have maintained a very close relationship with all of our customers.”

See related items:

Accel-RF launches high-power RF automated accelerated reliability test system for GaN devices

Accel-RF’s latest SBIR award to boost in-situ GaN device measurement

Search: Accel-RF GaN devices

Visit: www.accelrf.com