News

4 August 2010

 

Solar Metrology extends in-situ XRF tool portfolio for CIGS PV composition and thickness measurement

X-ray fluorescence (XRF) analysis system maker Solar Metrology of Hollbrook, NY, USA has expanded its SMX XRF tool portfolio for film composition and thickness measurement of copper indium gallium diselenide (CIGS) photovoltaic (PV) deposition with the addition of the System SMX LINEAR ISI.

Solar Metrology says that its SMX metrology tool platform provides a production-ready suite of film thickness and composition measurement tools for research and process development, in-process monitoring and post-process quality control. The firm adds that XRF is an enabling technology for CIGS manufacture, delivering yield management and improvement by allowing in-situ process control.

The SMX LINEAR ISI in particular provides in-situ cross-web or cross-panel gradient measurement of CIGS composition and thickness for thin-film solar PV metal film stacks on flexible roll-to-roll substrates such as stainless steel, aluminum and polyimide or rigid substrates such as float glass. Typical measurement applications include Mo (molybdenum) thickness and all CIGS combinations (including all CIG alloys and/or film combinations and final CIGS formulations).

Solar Metrology says that the SMX LINEAR ISI is fast, flexible and easily integrated into any vacuum deposition tool or vacuum process station or point of a vacuum process line. Despite this, the SMX LINEAR ISI platform does not affect the deposition process, since all SMX LINEAR ISI tool components reside outside vacuum, providing optimum performance and serviceability.

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Visit: www.solarmetrology.com