News

1 September 2009

 

LayTec moving to expanded premises ahead of 10th anniversary

This month, LayTec GmbH of Berlin, Germany, which provides in-situ thin-film monitoring systems, is moving to a new office that is twice as large as its existing facility. The firm says that it will now have more labs for R&D, as well as more room for production and quality control, customer seminars and hands-on trainings.

Also, on 9 October, LayTec will hold an ‘Oktoberfest’ party at the new office to celebrate the 10th anniversary of the firm’s formation. In the late 1990s, CEO Dr Thomas Zettler and his team at the Technical University of Berlin developed and patented what is claimed to be the first real-time epitaxy monitoring tool based on reflectance anisotropy spectroscopy (the Epi-RAS). LayTec was subsequently spun off in October 1999.

The firm currently provides solutions for monitoring metalorganic chemical vapor deposition (MOCVD), molecular beam epitaxy (MBE) and other thin-film growth processes (two thirds of the firm’s installed equipment is in production line applications for LEDs). However, since 2006 the application range of its in-situ monitoring systems has been expanded to amorphous and organic thin-film growth processes, e.g. sputter deposition, vapor thermal evaporation (VTE), and organic vapor phase deposition (OVPD).

LayTec says that in 2008 it recognized the strong demand from manufacturers of solar cells based on copper indium gallium diselenide (CIGS) and cadmium telluride (CdTe). Within a year, it received its first orders for SolR - its first in-line monitoring system for photovoltaic thin-film application (launched this February). LayTec is now cooperating with partners to further develop metrology solutions for the entire range of photovoltaic thin-film processes.

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Visit: www.laytec.de