News

20 July 2009

 

Bentham launches PV characterization system

In response to what is described as growing demand for an integrated solution for PV device and material characterization, light-measurement equipment maker Bentham Instruments Ltd of Reading, UK has developed the PVE300 system, which provides direct determination of device spectral response (SR, A W -1), external quantum efficiency (EQE/IPCE, %) and internal quantum efficiency (IQE, %).

The system consists of a light-tight measurement chamber, chopped monochromatic probe, dual-source input, one or two variable intensity bias sources, lock-in detection electronics and temperature-controlled vacuum mount. The system can be used with substrate, superstrate and packaged devices.

The PVE300 is modular and can be configured to cover both desired the spectral range (from 250-2500nm) and device type.

The new system will be showcased at the 24th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) in Hamburg, Germany (21-25 September).

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Visit: www.bentham.co.uk