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After going into administration (the equivalent of Chapter 11) on 31 March, high-resolution x-ray diffraction (HR-XRD) metrology maker Bede of Durham, UK has been acquired by Jordan Valley Semiconductors Ltd of Migdal Ha’Emek, Israel. Jordan Valley’s main shareholders are Clal Industries and Investments Ltd, Intel Capital and Elron Electronic Industries Ltd.

Bede X-Ray Metrology was founded in 1978 as a spin-off from the UK’s University of Durham, and has been listed on the London stock exchange since 2000. Revenues in 2007 were $11.6m.

“The acquired technology will fit into our product line almost seamlessly and will strengthen Jordan Valley’s position as the market leader in x-ray metrology,” claims Jordan Valley’s CEO Isaac Mazor. “With the consolidated x-ray metrology product line and expanded customer base, Jordan Valley becomes a comprehensive solution provider for current and future semiconductor process control and metrology challenges,” he reckons.

Jordan Valley provides metrology solutions for thin films based on rapid, non-contacting, and non-destructive x-ray technologies and offer a family of solutions based on advanced x-ray reflectivity (XRR), x-ray fluorescence (XRF), and small-angle x-ray scattering (SAXS).

See related item:

SEMATECH to use Bede x-ray system to evaluate high-k, metal gate, and SiGe materials

Search: Bede Metrology

Visit: www.bede.co.uk

Visit: www.jvsemi.com